Our customized Zeiss Sigma 500 VP scanning electron microscope (SEM) is built on a large chamber platform and equipped with the Gemini field-emission column with extended voltage available, yielding excellent count rates for spectrometry and spatial resolution to ~0.7 nm. The chamber is a dry variable pressure system, using a nitrogen gas atmosphere for low-vacuum analyses, and is equipped with a cascade current secondary electron detector for outstanding low-vacuum imaging quality.
We additionally have a standard Everhart-Thornley detector, a high-definition 5-segment backscatter detector, and a dual in-lens detector, for a full range of imaging capabilities.
For compositional analyses, our Sigma houses dual, co-planar (diametrically opposite), Bruker energy dispersive X-ray spectrometers and an integrated Bruker microspot X-ray fluorescence unit (µXRF).
Finally, our system is also equipped with the ATLAS control module and a 5-axis Cartesian stage to allow for large sample automated imaging.
For additional electron microscopy services available on MU’s Columbia campus, please also visit the Electron Microscopy Core website.